HIGH PERFORMANCE
SpectraStar XT-F is based on our True Alignment® Spectroscopy, a patent-pending technology that precisely calibrates the XT to first principle standards and then monitors and maintains the alignment for reliable, trouble-free analysis.

The XT-F uses the classic NIR wavelength range from 1100 nm to 2600 nm into the NIR region, providing adequate coverage for most applications and allowing direct and full calibration transfer from NIRSystems, FOSS, Bran + Luebbe, Bruker and Thermo systems.

EASY TO USE
SpectraStar XT comes complete with UScan™ software, an innovative software package that includes an intuitive graphical interface and a reliable database for data management. The 17" touchscreen makes sample analysis as easy as a few finger taps.

VERSATILE SAMPLING OPTIONS
SpectraStar XT-F's swivel top window design provides maximum sample handling flexibility. Sample cells and devices are available that allow analysis of fine and coarsely ground powders, slurries and liquids.

INLINE READY
All SpectraStar XTs are sealed and use no fans or cooling systems, so no filters or routine maintenance are required. SpectraStar XTs are designed for use both in the laboratory environment and inline for process control.

PRE-CALIBRATED OR CUSTOM APPLICATIONS
Many popular applications are available as pre-calibrated devices with plug and play functionality. Hundreds or other applications are available as initial calibrations or custom calibrations. Please review our instruments for preconfigured systems or fill out the form below based on your analytics needs. Let us offer you customized solutions for your application.